PI Offers PInano® and PIFOC® Objective Sample Scanners for Microscopy
This video presents Physik Instrumente (PI)’s piezo-based PInano® sample and PIFOC® objective scanners developed for Super Resolution Microscopy, Confocal Microscopy, and Atomic Force Microscopy. Objective scanners and piezo flexure stages of the PIFOC® and PInano® series offer high dynamics in scanning and positioning tasks. They provide high throughput and feature well-adapted solutions for XY specimen positioning parallel and vertical to the optical axis and Z focusing of the objective. The low profile piezomotor is easy to integrate, allowing testing at industrial-scale speed.
Run Time – 0:53min