Ellipsometry and reflectometry are two key optical measurement techniques used for surface analysis and thin-film characterization. While ellipsometry provides detailed analysis of film thickness and optical constants, reflectometry offers a simpler approach for surface roughness and bulk material properties.
By Dr. Noopur Jain
18 Feb 2025
Raman spectroscopy advances battery analysis by revealing critical data on electrode materials and electrolyte dynamics for improved energy storage performance.
Nanophotonics is transforming computing by using photons instead of electrons for data transmission. This technology improves processing speed, reduces energy consumption, and offers scalable solutions for AI, machine learning, and quantum computing.
Solar-heated homes with thermal energy storage systems offer a sustainable solution, improving energy efficiency and supporting eco-friendly practices.
By Ibtisam Abbasi
6 Feb 2025
Discover how the ARGUS Alignment Method™ is revolutionizing telescope technology by enhancing precision and performance.