Atomic force microscopy's (AFM) nanoscale imaging and measurement capabilities allow researchers to gain molecular-level insights into membrane morphology, fouling, surface interactions, and performance under simulated water treatment conditions. These unique capabilities make AFM instrumental in understanding and optimizing the membranes and barriers central to water purification technologies.
Image analysis of particles is one of the key methods for particle characterization. This article discusses the major steps during the image analysis of particles.
By Samudrapom Dam
20 Sep 2023
Crystallography provides insight into the structure and properties of materials at the atomic level. While X-ray diffraction has traditionally dominated crystallography, Raman spectroscopy is now emerging as a powerful complementary tool for studying crystalline systems and advancing our understanding of materials.
The surface topography of a material provides information on its mechanical and chemical characteristics, which are crucial in determining its applicability. Atomic force microscopy (AFM) is a robust analytical technique often employed to study the surface topography of the majority of materials. This article provides an overview of AFM and its application in surface-topography imaging.
By Bhavna Kaveti
18 Sep 2023
Here, we explore the current applications of Raman spectroscopy and look at how the field is developing. We evaluate the global market for this analytical tool and consider how it may change in the near future.
By Sarah Moore
18 Sep 2023