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Linkam Tensile Test Stage Chosen to Study Treatment of Tendon Injuries

Market leaders in temperature controlled microscopy, Linkam Scientific Instruments, have been chosen by the Physics Department of the University of Liverpool to study the effects of controlling stresses applied during the growth of collagen secreted from human fibroblast cells.

7 Jun 2011

New SEM from Hitachi Features Sub-Nanometer Resolution and 3 Million Times Magnification

The new SU9000 Field Emission (FE) Scanning Electron Microscope (SEM) from Hitachi High-Technologies features novel electron optics which allow 0.4 nm resolution to be achieved at an accelerating voltage of 30 kV, with a usable magnification up to 3 Million times.

31 May 2011

Fraunhofer Scientists Develop Ultra-Flat, High-Resolution Microscope

Scientists at the Fraunhofer Institute’s Applied Optics and Precision Engineering IOF located in Jena have developed a lightweight, flat microscope that analyses to a resolution of 5 µm.

24 May 2011

Olympus to Display Confocal Laser Scanning Microscope at Euspen

Olympus will be exhibiting at the upcoming European Society for Precision Engineering and Nanotechnology (EUSPEN) 11th International Conference and Exhibition in Lake Como, Italy from 23 – 26 May 2011. With expertise in the field of optical metrology, Olympus will display its LEXT OLS4000 confocal laser scanning microscope (CLSM) at booth 1314, as well as present an informative poster and participate in the commercial session.

23 May 2011

Olmpus Releases New Software for Confocal Laser Scanning Microscope and Multiphoton Excitation Systems

Olympus has introduced FV10-ASW 3.0, the latest version of its software for the FluoView FV1000 range of confocal laser scanning microscopes (cLSM) and Fluoview FV1000MPE (multiphoton excitation) systems.

17 May 2011

Olympus Show Off Confocal Laser Scanning Microscope at International Metrology Show

Olympus attended the recent International Conference on Metrology and Properties of Engineering Surfaces, where it displayed its advanced measuring confocal laser scanning microscopy, the LEXT OLS4000. Hosted by the National Physical Laboratory (NPL), the event was highly successful with a record number of delegates in attendance.

15 May 2011

Olympus Launches New Family of Materials Science Microscopes

Olympus has aunched the latest version of its highly successful Olympus Stream materials science microscopy imaging software family at booth 1512 in hall 1 at Control, Stuttgart. Olympus Stream 1.6 provides a number of new and improved features, which not only increase workflow efficiency, but also enhance the overall capabilities of the software.

3 May 2011

New Iverted Microscope from Olympus Automatically Maintains Focus

Olympus has today announced the release of the inverted IX81 microscope with ZDC2 Z-Drift compensation system. This next generation solution ensures that your samples are always in focus, providing extremely sharp images. The two modes, continuous and ‘one-shot’, enable the completion of any time-lapse experiments.

18 Apr 2011

Olympus LEXT OLS4000 Being Used to Develop Standards in Optical Metrology

The Olympus LEXT OLS4000 is being used as a benchmark tool for the development of good practice guidelines and new reference standards in optical metrology.

7 Apr 2011

Olypmus to Exhibit at Internatihnal Metrology Conference

Olympus has today announced that it will be exhibiting at the 13th International Conference on Metrology and Properties of Engineering Surfaces. Hosted by the National Physics Laboratory (NPL), the conference will take place from 12 – 15 April 2011 at the Twickenham Stadium in London.

31 Mar 2011