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Electrochemical Imaging Microscopy Improves TNT Trace Detection Process

Arizona State Univeristy scientist N.J. Tao and his colleagues at the Biodesign Institute have hit on a new, versatile method to significantly improve the detection of trace chemicals important in such areas as national security, human health and the environment.

12 Mar 2010

New Atomic Force Microscope for Nanoscience Applications

Veeco Instruments Inc., the leading provider of atomic force microscopy technology to the nanoscience community, announced today the Dimension® Edge™ Atomic Force Microscope (AFM) System for physical and life sciences investigation.

From Veeco 11 Mar 2010

Princeton Team Use Confocal Microscopy to Study Embryonic Development

A Princeton University-led research team has discovered that protein competition over an important enzyme provides a mechanism to integrate different signals that direct early embryonic development.

10 Mar 2010

Olympus Introduces Advanced Cell TRIF System

Longstanding TIRF microscopy specialist Olympus has today introduced the new advanced cell^TIRF system as part of its newly launched xcellence live cell fluorescence imaging station. Olympus cell^TIRF enables ultra sensitive simultaneous multi-colour total internal reflection fluorescence microscopy offering 4 laser channels with independent beam paths.

10 Mar 2010

Leeds Precision Instruments to Distribute Olympus America's Microscopes in the U.S.

Olympus America Inc. continues to build its industrial instrument distribution network, naming Leeds Precision Instruments, Inc., to handle distribution of Olympus Industrial Microscope products in an expanded region to include Arizona, New Mexico, Colorado, Montana, Utah, Wyoming and eastern Idaho.

5 Mar 2010

Modern Diagnostic Tools Help Detect Early-Stage Skin Cancer

According to estimates from the American Cancer Society, melanoma, the most serious form of skin cancer, was responsible for an estimated 8,650 deaths in the United States in 2009.

5 Mar 2010

ASPEX to Display New Personal Scanning Electron Microscope at Pittcon 2010

ASPEX Corporation (ASPEX) has been advancing the novel Personal Scanning Electron Microscope (PSEM) platform since its first product generation was released in 1992.

4 Mar 2010

Omnyx Licences Patents in Virtual Microscopy and Digital Pathology Field

Olympus America Inc. has signed a nonexclusive worldwide licensing agreement with Omnyx, LLC, a joint venture of GE Healthcare and the University of Pittsburgh Medical Center, allowing Omnyx to access an extensive portfolio of Olympus America patents in the field of virtual microscopy and digital pathology, to help develop solutions in the digital pathology field.

3 Mar 2010

Omnyx to Access Olympus Patents for Future Imaging and Data Handling Technologies

2 Mar 2010

Software Upgraded MK4 EMI Compensation System Enhances Electron Microscope Performance

The globally proven MK4 EMI Compensation System from Integrated Dynamics Engineering (IDE) has been extensively upgraded with a unique graphical interface software program called Kathak, an advanced installation and diagnostics tool.

25 Feb 2010