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Andor EMCCD Cameras Help in Redefining Optical Microscopy Boundary

Andor Technology’s EMCCD cameras have been deployed to help a US research team in redefining the optical microscopy boundaries.

31 Jul 2010

EPSRC Award Granted for Optical Nanoscopy Technology Development

A researcher from Cardiff School of Biosciences, Dr. Paola Borri, has won the EPSRC (Engineering and Physical Sciences Research Council) Leadership Award of £ 1.1 million, for the following five years.

28 Jul 2010

New Phenom Pro Suite Automates Image Collection and Analysis for Desktop SEM

Phenom-World BV, producer of the Phenom desktop scanning electron microscope, announces the launch of a new software product, the Phenom Pro Suite.

21 Jul 2010

Micorscience 2010 Sets New Delegate Record

MICROSCIENCE 2010, the Royal Microscopical Society's flagship meeting held at ExCeL London at the end of June, attracted 519 conference delegates - the first time that the 500-barrier has been broken. And, the overall visitor-target of 2,000 was also reached.

From Royal Microscopical Society 19 Jul 2010

Carl Zeiss Launches New EVO HD Scanning Electron Microscope

Carl Zeiss, provider of medical research and industrial solutions, has launched a new EVO HD scanning electron microscope in the C-SEM (conventional Scanning Electron Microscopy) market.

From Carl Zeiss Microscopy GmbH 17 Jul 2010

Olympus and Biolmagene Sign Patent License Agreement

Olympus America, specialist in next-generation microscope imaging systems, has signed a licensing agreement with a California-based company, Biolmagene.

17 Jul 2010

Combined Atomic Force Microscopy-Raman Systems from Veeco Instruments

The atomic force microscopy technology company, Veeco Instruments, has launched the IRIS (Integrated Raman Imaging System) models for the BioScope Catalyst and Innova AFMs (Atomic Force Microscopes).

From Veeco 15 Jul 2010

New CSP Optical Test Socket from Aries Electronics

Aries Electronics has announced its new CSP test socket that is used for failure analysis (FA) testing for optical sensor, or EMMI (emission microscopy) applications.

30 Jun 2010