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Integrated Microscope Allows Users to Switch to AFM Imaging from 3D Optical Measurements

Nanoscience Instruments has released a three-dimensional optical microscope system combined with an atomic force microscope (AFM), which includes a small Nanosurf LensAFM and advanced Zeta Instruments optical profiler.

From Nanoscience Instruments. Inc. 1 Jul 2011

Phenom-World Launch New Products to Improve the the Capabilities of Their Desktop SEMs

With these two launches Phenom-World further extends the usability of the Phenom G2 desktop SEM’s. Giving the opportunity to image vacuum-sensitive and vulnerable samples without damaging the sample structure by using the Temperature Controlled Sample Holder. Secondly the new version of Fibermetric is able to take the analysis of fibers and filter to an even higher level.

30 Jun 2011

Scientists Demonstrate that Microlaser can Identify Nanoparticles

A graduate student in electrical and systems engineering of Washington University, Lina He with her colleagues showed that microlasers can be used to identify particles with a radius of 10 nm. These microlasers offered a resolution limit of about 1 nm.

29 Jun 2011

WiTec Unveils Excitation-Laser Coupling Device for Polarization Experiments

WiTec has rolled out an excitation-laser coupling device that facilitates convenient usage of the alpha500 and alpha300 microscope series.

From WITec GmbH 29 Jun 2011

Carl Ziess Donate Microscope to Help High School Biology Students Learn from UMass Medical School Laboratories

Carl Zeiss MicroImaging, a leading provider of microscopy solutions, announces that it recently donated a $5,000 state-of-the-art microscope for use in the UMass Labs for Worcester Area High Schools program, which allows Advanced Placement biology students from public high schools and technical schools in and around Worcester, Massachusetts to visit and learn from scientists in UMass Medical School laboratories.

From Carl Zeiss Microscopy GmbH 27 Jun 2011

New High Performance Models Added to Superresolution Microscope Stage Series

PI (Physik Instrumente) LP has added two higher-performance models to its successful PInano™ superresolution (SR) microscope stage series.

From PI (Physik Instrumente) LP 20 Jun 2011

News Sales Opportunities for T-MIP Clients

Reflecting current trends in sales and marketing alignment, The Microscopy & Imaging Place (T/MIP) and Technology Business Consulting (TBC) have entered into a strategic relationship. The new affiliation dramatically expands sales development, analytics, and CRM services for T/MIP clients.

19 Jun 2011

Pittcon Offering Discounted Rates for Exhibitors Until July 15

The Pittcon Exposition Committee is now accepting booth space reservations for Pittcon 2012, which will be held March 11-15, 2012, at the Orange County Convention Center in Orlando, Florida. The discounted rate of $2,150 for a standard 10' x 10' space will be available to all exhibitors up to July 15, 2011.

From Pittcon 15 Jun 2011

LOT offers AFMs and Optical Surface Profilers at Discounted Price

LOT announced that it is providing the XE-100 AFMs (atomic force microscopes) at a discounted price for a limited period. The AFMs are a product of Park Systems with step-and-scan automation and a decreased drift rate.

10 Jun 2011

Olympus Introduce New Silicon Oil-Immersion Objectives

Olympus has introduced two new silicon oil-immersion objectives, the UPLSAPO30xS and UPLSAPO60xS. The new lenses are ideal for live cell experiments, particularly those investigating thick samples or requiring long-term imaging. Users can generate bright images at higher resolution, as silicon oil significantly improves optical performance in comparison to conventional oil- or water-based approaches.

9 Jun 2011