Free #Webinar ALERT!! "#Measuring My #Laser…Where Do I Start?" May 18th , 10:00 am (UTC+03:00) Jerusalem / 06:00 p.… https://t.co/yT5iFzAUb1
May 16 2022 5:45am
NEW! Get your #laser_measurement ‘Content Fix’ on the go with #Playter on Ophir #audio channel! Listen to Ophir’s c… https://t.co/UuwbUJ4J6d
May 11 2022 7:54am
Thank you for visiting us at 2022 @PHOTONICSWORLD trade show! Here's a taste of what we've had there…… https://t.co/HvmJVcCTp1
May 5 2022 12:19pm
With over 35 years of experience, Ophir Photonics, a Newport Corporation company, provides a complete line of instrumentation including power and energy meters, beam profilers, spectrum analyzers, and goniometric radiometers.
Dedicated to continuous innovation in laser measurement, the company holds a number of patents, including the R&D 100 award-winning BeamTrack power/position/size meters; BeamWatch®, the industry’s first non-contact, focus spot size and position monitor for lasers in material processing; and Spiricon’s Ultracal™, the baseline correction algorithm that helped establish the ISO 11146-3 standard for beam measurement accuracy. The Photon family of products includes NanoScan scanning-slit technology, which is capable of measuring beam size and position to sub-micron resolution.
The company is ISO/IEC 17025:2005 accredited for calibration of laser measurement instruments. Their modular, customizable solutions serve manufacturing, medical, military, and research industries throughout the world.
An Introduction to Laser Profiling
Measuring Beam Characteristics for Successful Laser Marking
Ensuring Accuracy in Camera-Based Laser Beam Profiling Systems
What Happens to Your Weld When Welding with High Power Over Long Periods of Time?
Measuring Performance in High-Power Industrial Laser Systems
How to Find the Perfect Laser Beam Profiler
Choosing a Camera Technology to Work Best for Beam Profiling Applications
M-Squared: The Key Performance Indicator (KPI) of Lasers
The Importance of Laser Beam Measuring Equipment in the Industrial Manufacturing World
Defining the Response Time and Integration Time of Energy Sensors
An Introduction to Industrial Laser Beam Profiling
Using Critical Laser Scribing Processes for Solar Cell Manufacturing
Using Calibrated Photodiodes to Measure LED Power and Irradiance
Using the RM9 Radiometer System to Measure Very Low Power IR Lasers
Measuring High Power Lasers
MKS Instruments Announces Ophir® Ariel, Ultra-Compact Laser Power Meter for Measuring High Power Industrial Lasers in Confined Spaces
This product profile describes the properties and applications of the ProMetric® I-SC Solution Imaging Colorimeter.
The Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index.
Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.
Prof. Simon Scheuring & Dr. Alma P. Perrino
AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the single-molecule kinetics of wild-type bR (bR-WT) exposed to continuous light and short light pulses.
R. Bruce Weisman
AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.