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Nordson DAGE Bondtester Pad Cratering Inspection System Wins Global Technology Award

Nordson DAGE, a provider of bond test equipment and digital X-ray inspection systems for the semiconductor and printed circuit board assembly industries, has won a Global Technology Award for its bond equipment, the 4000Plus Bondtester Pad Cratering Inspection System.

18 Nov 2011

Advanced Extreme-Ultraviolet Microscope for Creation of Computer Chips

The Lawrence Berkeley National Laboratory has developed the Semiconductor High-NA Actinic Reticle Review Project (SHARP) microscope for photolithography.

3 Nov 2011

Laser Based Setup Improves the Efficiency of Organic Solar Cells

Organic solar cells have the potential to convert sunlight into electrical energy in an economical and environmentally friendly fashion. The challenge is that they still work less efficiently than inorganic semiconductors. Ultrafast measurements on hybrid cells now reveal a route to double their efficiency.

24 Oct 2011

Fujitsu’s New Optical Amplifier Technology Developed for Optical Access Systems

Fujitsu and Fujitsu Laboratories have developed a new optical amplifier technology to be utilized in the optical access systems, which connects central offices to the subscribers. This new optical technology enables the splitting number into four times and double the transmission distance.

15 Oct 2011

Magnachip to Deliver AMOLED Display Driver ICs for Samsung’s Galaxy S2 LTE Smartphone

Korean company Magnachip Semiconductor, specialising in the design and manufacture of mixed-signal semiconductor and analogue products has announced that it will supply its display driver ICs to be used in the AMOLED display panels in the Galaxy S2 LTE Smartphone from Samsung.

12 Oct 2011

Imec Realizes High-Speed SiGe:C Heterojunction Bipolar Transistors

Imec, a nanoelectronics company, has demonstrated a high-speed SiGe:C heterojunction bipolar transistor (HBT) device designed for large volume millimeter-wave low-power circuits in applications for automotive radars.

From imec Inc. 12 Oct 2011

Texas Instruments Introduces DAC8562 for Portable Medical Devices

Texas Instruments (TI) has launched the DAC8562 family of dual 12-, 14- and 16- bit digital-to-analog converters (DACs). The DACs can be used in portable medical devices, laser modules, and wireless base stations.

24 Aug 2011

Nova Introduces Optical CD Metrology System with Multi-Channel Reflectometry

Nova Measuring Instruments has launched its new optical critical dimension (Optical CD) metrology system called Nova T600 to control the processes of sophisticated vertical architectures for the 22 nm technology node and further.

From Nova 12 Jul 2011

Zeta Instruments to Showcase Optical Metrology Technology at Intersolar North America Conference

Applied Materials in collaboration with Zeta Instruments, a manufacturer of precision optical profilers designed for micron-scale surface analysis, has published a paper titled, 'Texture Process Monitoring in Solar Cell Manufacturing Using Optical Metrology,’ which was presented at the 37th IEEE Photovoltaic Specialists Conference 2011.

11 Jul 2011

Graphene Breakthrough Moves it Closer to Applications in Optoelectronics

Graphene, a layer of carbon atoms only one-atom thick but about 200 times stronger than steel, is also one of the best electrical and thermal conductors on earth. In spite of the impressive list of promising prospects, graphene has a darker side: it does not have a band-gap, once it is conducting it cannot be switched-off.

7 Jun 2011

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