JVS Launches High Resolution XRD System for Quality Control in LED Manufacturing

Jordan Valley Semiconductors Ltd. (JVS), the market leader in X-ray metrology tools, has introduced today the QC3(TM), a High Resolution XRD (HRXRD) system which controls production quality at LED and compound semiconductors fabs.

JVS continues to evolve the company's HRXRD product line, which it acquired from Bede in 2008, with the addition of the new tool. The QC3(TM) HRXRD (High Resolution X-Ray Diffraction) system was developed on the basis of Bede's industry-proven QC200(TM) and D1(TM) systems. The new system improves hardware performance for higher productivity and system reliability, and reduces both cost of ownership and system price by tailoring the functionality to the specific needs of its customers. These improvements are achieved through the optimization of both the hardware and software.

Isaac Mazor, JVS's President and CEO, said: "The new QC3(TM) HRXRD production tool demonstrates JVS's commitment to LED manufacturing metrology solutions that meet and exceed our customers' technical and cost of ownership expectations."

"The tool has been built with our customers' needs in mind. Customers are looking for accuracy, repeatability, low cost of operations, ease of service and excellent price/performance - and our QC3(TM) system delivers all of these requirements," added Mr. Mazor.

Dr. Paul Ryan, Corporate VP and UK site manager, said: "By optimizing the configuration to the specific market segment needs, the QC3 meets our customers' process technology needs at outstanding price/performance ratio. With our field proven and popular control and analysis software tools, such as RADS, our customers enjoy the ease of operation with outstanding accuracy and repeatability that are key for today's demanding compound semiconductors process control tasks."

Source: http://www.jvsemi.com/