Sponsored Articles

Multilayer Piezoelectric Actuators - Properties and Performance of Ceramic and Polymer Coated Multilayer Piezo Actuators by Physik Instrumente

The patented PICMA® technology makes it possible to manufacture components with a particularly long lifetime. Decades of experience with PICMA® series in various applications show that the lifetime has been increased by at least a factor of 10 compared to previously used, conventional, polymer-coated, multilayer piezoelectric actuators.

From PI (Physik Instrumente) LP 11 Oct 2009

FP8800 Flame Photometer - FP8800 Flame Photometer Setting New Benchmarks in Flame Photometry

The brand new FP8800 is setting new benchmarks in flame photometry. Its purpose is simple, precise and inexpensive determination of alkaline elements in aqueous solutions in laboratory and process analytics.

From A.KRÜSS Optronic GmbH 22 Jun 2009

Interferometric Optical Profilers - The Most Flexible and Effective Metrology Tools Available

Optical profilers are microscopes that use the interference of two beams of light for characterizing surface topographies.

From Veeco 22 Jun 2009

Combining Atomic Force Microscopy and Optical Microscopy to Detect Changes in Cell Morphology

The high resolution imaging capability of AFM has recently facilitated the construction of atomic models of supramolecular assemblies from topographical images of photosynthetic proteins and channel proteins.

From Veeco 22 Jun 2009

Combining Atomic Force Microscopy and Optical Microscopy to Study the Interaction Between Dopamine and D1-Receptor in SH-SY5Y Cells

In the present study we investigated the potential application of force measurements in monitoring the response and binding properties of dopamine D1 receptor upon stimulation with dopamine.

From Veeco 22 Jun 2009

High-Resolution Imaging of Native Lens Membranes and Constitutive Protein Components Using Atomic Force Microscope

In this application note, we demonstrate the utility of AFM in delineating the cause of cataracts. High-resolution imaging of native lens membranes and the constitutive protein components was achieved using a customized Veeco atomic force microscope.

From Veeco 22 Jun 2009

Advantages of Using Dektak Surface Profilers with Vision 3D Analysis Software

This application note describes the advantages of 3D measurement options available through a combination of Veeco's Dektak Stylus Profiler and Vision 3D analysis software.

From Veeco 22 Jun 2009

High-Definition Vertical Scanning Interferometry Enables Greater Measurement Detail

Optical profilers are microscopes that use the interference of two beams of light for characterizing surface topographies. Veeco¡¯s new high-definition vertical scanning interferometry (HDVSI) mode uses an algorithm to give subnanometer precision on a range of surfaces in a single measurement

From Veeco 22 Jun 2009

Automatic Step Detection Feature for Dektak Surface Profilers

Dektak stylus profilers provide accurate step height measurements from several nanometers through hundreds of microns, with repeatability down to 7.5 Angstroms.

From Veeco 22 Jun 2009

Nanoscale Thermal Analysis of Polymers

The Veeco Instruments Thermal Analysis (VITA) module enables nanoscale thermal analysis (nTA), a novel technique that allows the determination of the local transition temperature on the surface of a material with nanoscale spatial resolution.

From Veeco 22 Jun 2009