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Results 131 - 140 of 169 for Semiconductors Related Devices
  • Article - 9 Mar 2021
    Metalenses are flat surfaces etched with nanostructures that manipulate and focus light. They possess unique properties that cannot be achieved with conventional diffractive surfaces.
  • Article - 7 Jan 2021
    In this interview, Dr. Erik Novak, from 4D TechnologyTM, talks to AZoM about 4D dynamic interferometry.
  • Article - 8 Jul 2020
    A new microscopy technique to improve scientists’ ability to characterize the electrical properties of nanomaterials has been developed, with researchers hoping their invention will pave the way for...
  • Article - 21 Feb 2020
    Digital imaging technology has revolutionized everything from the way we communicate to every field of scientific research. Starting from humble beginnings, camera sensor technology is still evolving...
  • Article - 5 Jun 2017
    Researchers led by Frank Koppens at the Institute of Photonic Sciences in Barcelona have successfully integrated graphene with CMOS to operate as an ultrasensitive digital camera1.
  • Equipment
    The RAM II from Bruker is the first dual channel FT-Raman module that is capable of being coupled to the VERTEX FT-IR research spectrometer series. The RAM II provides the ideal FT-Raman measurement...
  • News - 8 Jul 2007
    Researchers from around the world will present new breakthroughs in optics, photonics and their applications at the 2007 Conference on Lasers and Electro-Optics/Quantum Electronics Laser Science...
  • Article - 19 May 2025
    Optical computing offers speed, parallelism, and energy efficiency. But memory limitations, infrastructure incompatibilities, and high costs are holding it back. Here's what’s needed to bring it into...
  • Article - 9 Apr 2025
    Explore how camera lenses are made, from precision design and material selection to manufacturing, assembly, and recent innovations like AI-based design and ultrathin metasurface lenses.
  • Article - 18 Feb 2025
    Utilizing light reflection, ellipsometry and reflectometry provide distinct approaches to thin-film characterization, crucial for advanced material analysis.

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