Atomic force microscopy (AFM) has become an essential characterization tool in polymer research due to its unique capacity for multifunctional, nanoscale imaging and measurement. Recent advances have enabled AFM to probe complex polymer structures, functions, and behavior under real-world conditions across various scales.
NMR spectroscopy is a non-destructive technique used to analyze the structure of a molecule by exploring its electronic orientation. This article examines the advantages and limitations involved in the application of NMR spectroscopy and provides an overview of its industrial application.
By Bhavna Kaveti
1 Aug 2023
This article explores the versatility, working principles, and building blocks of PID controllers.
Since its invention in the 1980s, the atomic force microscope (AFM) has become indispensable for nanoscale imaging and metrology across scientific fields. At the heart of the AFM lies a host of precision components working in unison to acquire high-resolution topological images.
The accuracy of imaging results is influenced by several external factors, including movements that cause vibrations around the samples. Equipment such as anti-vibration tables plays a critical role in reducing vibrations and ensuring safety, consistency, and quality to produce highly precise results.
By Samudrapom Dam
25 Jul 2023
This article talks about the importance of trust and partnership in optical component manufacturing.
While AFM is commonly used for imaging in air and vacuum environments, the question arises: Can AFM be used for imaging in liquids? In this article, we will delve into the challenges and possibilities of using AFM in liquid environments.
By Ibtisam Abbasi
24 Jul 2023
Spectroscopy is a promising tool for characterizing compounds in many research fields. This analytical tool has created an unbroken bond with forensics and has evolved into the exclusive field of forensic spectroscopy.
By Bhavna Kaveti
20 Jul 2023
An anti-reflection coating is a dielectric thin film coating with a specific refractive index and thickness. The coating is applied to an optical surface to reduce the reflectivity/reflectance of that surface due to Fresnel reflections in a specific wavelength range.
By Samudrapom Dam
17 Jul 2023
Characterizing the surface topography of materials and devices is vital to determine their mechanical and physical properties. This article will look at the field of surface metrology and how atomic force microscopy (AFM) can benefit the analysis of complex surface features.
By Reginald Davey
14 Jul 2023