Jul 21 2007
As a leading manufacturer of microscopy systems for industrial quality control, the optics manufacturer Leica Microsystems will this year again be represented at the international trade fair for quality assurance.
Advanced control systems for component and material cleanliness will be the main focus at the Leica booth in 2006.
In Sinsheim, Leica will be presenting the new system solution Steel Expert. Consisting of high-end software, the automated inverted industrial microscope Leica DMI5000 M and a highly sensitive color camera, the industrial system meets all requirements for the detection of non-metallic inclusions in modern steel types. It meets all steel purity test standards and is also prepared for the anticipated new steel inclusion standard DIN EN 10247, which is exactly defined mathematically and expected to be released early 2007.
Especially for particle analysis, for example on filters for quality assurance, Leica has come up with another system solution: Leica QClean determines size and number of dirt particles on a sample, in accordance with the customer'srequirements. The application package, which is suitable for the cleanliness analysis of micro-mechanical components such as gearings, crankshafts, camshafts or motors, as well as for hydraulic fluids and fuels, also includes, in addition to the dirt analysis software, the automated industrial microscope Leica DM6000 M and a camera. The software analyzes the filters in accordance with the specifications in VDA Volume 19 and ISO 16232.
A further novelty on the Control is the fully apochromatically corrected 6.3-fold zoom system Leica Z6 APO with a motorized cross-stage. With its flat design and precise control of the X and Y axes, the cross-stage not only facilitates the daily inspection work, but also opens up several new application possibilities forhigh performance macroscopy. In combination with the software for cleanliness analysis, for example, it complements the application systems for residual dirt analysis as a starter's version, when the particle size to be measured does not require a compound light microscope.
http://www.leica-microsystems.com/