SHOKAI® is an American corporation, with over 35 years experience in manufacturing and importing electronic and mechanical components from the Far East.
In all that time, we have had one mission: To supply quality components and assemblies in quantity, at a fair price, to OEMs.
We were serving domestic and international manufacturers long before anybody with an internet connection and a browser could claim to be an overseas supplier. And we will be here long after they are gone.
We speak your language. We understand you - your time frames - your requirements - the pressures placed on you - the quality and personal attention you and your customers demand. As experienced buyers and design engineers have learned, let SHOKAI® be your source for components from Japan, Taiwan, Hong Kong, and China.
We pride ourselves on "going the extra mile" for our customers. With one call, fax or e-mail to us, you can let us show you what that extra effort means. Put the resources of SHOKAI® to work for you. You won't be sorry.
This product profile describes the properties and applications of the ProMetric® I-SC Solution Imaging Colorimeter.
The Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index.
Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.
Prof. Simon Scheuring & Dr. Alma P. Perrino
AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the single-molecule kinetics of wild-type bR (bR-WT) exposed to continuous light and short light pulses.
R. Bruce Weisman
AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.