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Results 1351 - 1360 of 1399 for Analysis and measurement
  • What is a Lumen?
    Article - 22 Sep 2014
    A lumen is as a unit of measurement indicating the level of brightness emitted from lighting products such as bulbs and tubes, and natural light.
  • Moiré Pattern - Description and Applications
    Article - 15 May 2014
    Moiré patterns occur when materials are overlapped with repetitive lines. It is a naturally occurring interference pattern created by overlaying similar but slightly offset templates.
  • Applications of 3D Microscopy
    Article - 6 May 2014
    The technical field of microscopy deals with the use of different types of microscopes to view and study samples and objects that otherwise cannot be viewed with the naked eye.
  • Recent Upgrades of Calibration System with a Laser Interferometer
    News - 24 Sep 2007
    A calibration service company has recently upgraded its laser calibration system with a laser interferometer, which minimises transportation and set-up times. In germany, Juergen Emslander has...
  • Using a Smartphone for Virus Detection
    Article - 26 Sep 2013
    Advancements in smartphones are continuing to progress with an effort to making these phones capable of being applied in sophisticated fields of application including laboratory analysis.
  • What is a Periscope?
    Article - 11 Sep 2014
    A periscope can be defined as an optical instrument that allows the viewing of objects that are not in the direct life of vision. Periscopes prove to be of great help to submariners to have a view of...
  • Using the Instrument Transfer Function (ITF) to Interpret Interferometric Height Measurements
    Article - 4 Apr 2013
    Exploring the ITF's role in enhancing interferometric height measurements by characterizing system responses to frequency variations in metrology tools.
  • Veeco Next Generation Surface Profiling System for Semiconductors from Veeco
    News - 21 Aug 2007
    Veeco Instruments Inc., today announced the release of its latest generation of industry-leading SP products for backend semiconductor metrology. The Wyko(R) SP9900(TM) Surface Profiling System...
  • What is Raman Spectroscopy?
    Article - 22 Aug 2012
    Raman spectroscopy is a widely used technique that can help identify chemicals or materials by the way in which they scatter light.
  • Leica Enhances Leica Application Suite
    News - 21 Jul 2007
    Leica Microsystems is pleased to introduce an enhanced version of Leica Application Suite that integrates Leica automated microscopes, digital cameras and software into one common environment to...

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