Lumetrics, a manufacturer of precision non-contact thickness measurement and non-contact optical inspection systems, today announced the launch of its new Wavefront Sensor product family.
Building upon the Shack-Hartmann sensor, the new Lumetrics Wavefront Sensors system offers a complete wavefront measurement package with an integrated CMOS camera, Wavefront Control Center software and easy-to-use Wavefront-API. The camera sensor offers an intuitive user interface with a more efficient setup evaluation, visible wavelength camera and customizable integration with the Wavefront-API to fit any measurement needs.
Wavefront measurements are ideal for analyzing optics-related products and materials, including:
- Contact lenses and interocular lenses
- Lens stack quality
- Laser beam analysis
- Surface measurements
- Transmitted wavefront error
- Optical alignment
- Phase parameters
"The latest addition to our non-contact measurement product family is a real jump in reliability and usability for wavefront measurement,” said John Hart, President and CEO of Lumetrics. “Lumetrics Wavefront Sensors bring the power of Zernike polynomials to day-to-day quality testing for optical systems and materials.”
Visit https://www.lumetrics.com/lumetrics-wavefront-sensors or see a demonstration of wedge and lens stack measurement at SPIE Optifab, Booth 315.