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Mahr Inc. to Feature AVT 300 M, a Customized Solution for Radius of Curvature (Roc) and Tool Offset Measurements in SPDT Applications, at SPIE Photonics West 2020

Mahr Inc., a leading provider of dimensional metrology solutions, will highlight its customized AVT 300 M solution for Radius of Curvature (RoC) and tool offset measurements in single point diamond turning (SPDT) applications in booth #1267 at SPIE Photonics West 2020. With instruments including interferometers, profilometers, precision gages, white light and confocal microscopy, and more, Mahr provides a full range of metrology solutions to meet optical manufacturing needs.

This includes solutions for measuring planar and spherical; aspheric; freeform; diffractive; and micro-optic elements. The AVT 300 M utilizes a 40 mm aperture Fizeau interferometer in conjunction with a motorized, 300 mm, vertical stage to allow for automated measurements of spherical or flat components (larger apertures and stages are also available). The solution allows for measurements of RoC and tool offset with an accuracy of <0.5 µm and <0.3 µm, respectively.

Additional products highlighted at the show will include:

  • MarSurf CM explorer, a compact confocal microscope for the three-dimensional measurement and analysis of surfaces.
  • MarSurf LD 130 / 260 Aspheric, a high-precision 2D / 3D surface measuring station for characterizing contour and roughness on optical components.
  • Integrated wireless product family including Micromar micrometers, MarCal calipers and MarCator indicators.

SPIE Photonics West 2020 will take place from February 4-6, 2020 at the Moscone Center in San Francisco, CA. Visit booth #1267 to learn more.

Source: http://www.mahr.com

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