ADE Corporation is a leading supplier of metrology and inspection systems for the semiconductor wafer, semiconductor device, magnetic data storage and optics manufacturing industries. Wafer suppliers and device manufacturers worldwide rely on ADE measurement and inspection systems to certify and ensure the highest quality bare silicon substrates. ADE's most recent generation of products serve both 65nm in-line manufacturing applications and 45nm process development. Semiconductor device yields begin with the bare wafer, and ADE's leading technology provides early insight into surface defect, shape, flatness and nanotopography of these advanced 300mm substrates.
This product profile describes the features and applications of Mounts and Mounted Optics.
This product profile describes the features and characteristics of the zoom lens.
The Thermo Scientific™ ARL™ EQUINOX 3000 X-ray Diffractometer for research enables accurate measurements.
In our new interview, AZoOptics talks to Cheng Guo about his new report on Weyl semimetals and how they can be employed by researchers in the field of photonics.
Prof. Wei Huang and Dr. Chenxin Ran
In this interview, AZoOptics talks with Prof. Wei Huang and Dr. Chenxin Ran about their paper analyzing the extraordinary role of metal halide perovskites in the optoelectronic industry. After discussing the progress and significance of this field over the past decade, their research looks toward the revolutionary devices of the future.
In this interview, AZoOptics talks to Davis Bowling, who provides guidance into extended reality (XR) optical testing and demonstrates how to optimize the testing process.