SiGlaz provides manufacturers of ICs, magnetic media and flat panel displays with intelligent software to increase productivity and yield. SiGlaz spatial signature analysis (SSA) software analyzes large volumes of data generated by in-line inspection and metrology tools to determine the root cause of manufacturing problems in seconds.
The Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index.
This product profile outlines Radiant’s Near-Eye Display Test Solution with Electronic Focus and how XRE lenses are used.
Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.
Prof. Simon Scheuring & Dr. Alma P. Perrino
AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the single-molecule kinetics of wild-type bR (bR-WT) exposed to continuous light and short light pulses.
R. Bruce Weisman
AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.