Filmetrics® F20 Thin-Film Analyzer: Accurate, Affordable, ReliableThe Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index. From Filmetrics, a KLA Company
XRE Lens—Near-Eye Display Test SolutionThis product profile outlines Radiant’s Near-Eye Display Test Solution with Electronic Focus and how XRE lenses are used. From Radiant Vision Systems
Dynamic Characterization of Encapsulated MEMSDynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS. From Polytec
Improving Breast Cancer Imaging with a Deep-Learning Algorithm Dr. Keith Paulsen AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.
Line-Scanning High-Speed Atomic Force Microscopy and the Future of Optogenetics Prof. Simon Scheuring & Dr. Alma P. Perrino AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the single-molecule kinetics of wild-type bR (bR-WT) exposed to continuous light and short light pulses.
Revealing Early Signs of Damage in Cement Using Near-Infrared Fluorescence R. Bruce Weisman AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.