Spectra Systems is a market driven company that is changing the way businesses mark, sense, track and authenticate their products from production line to point of purchase.
Our cross-platform technologies, based on advanced materials and proprietary hardware and software systems, offer an integrated approach that provides our customers with complete solutions.
Whether hiding a barcode, reliably marking products exposed to harsh environments, accurately sensing colors or authenticating currency, Spectra's innovative products provide customers with improved processing efficiencies and increased accuracies and speeds.
Our systems combine consumable, engineered optical materials with software and hardware in an interdependent relationship. We have commercialized our systems by creating new technologies as well as by enhancing existing technologies with our proprietary and patented materials to create solutions to meet our customers' processing, authentication and manufacturing needs.
Our approach, based on advanced materials and enabling hardware and software systems, offers an integrated approach that provides customers with complete solutions.
We serve many industries, including security packaging, brand protection, document authentication and processing, postal automation enhancement and optical media marking.
The Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index.
This product profile outlines Radiant’s Near-Eye Display Test Solution with Electronic Focus and how XRE lenses are used.
Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.
Prof. Simon Scheuring & Dr. Alma P. Perrino
AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the single-molecule kinetics of wild-type bR (bR-WT) exposed to continuous light and short light pulses.
R. Bruce Weisman
AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.