Micron is one of the world's leading providers of advanced semiconductor solutions. Micron’s DRAM and Flash components are used in today’s most advanced computing, networking, and communications products, including computers, workstations, servers, cell phones, wireless devices, digital cameras, and gaming systems. Micron also provides CMOS image sensor solutions to the handset camera, digital still camera, and PC video camera markets. As the leading worldwide provider of CMOS image sensor solutions, Micron offers the technology leadership, product portfolio, and dedicated customer focus to make your image-capture applications more successful.
Our imagers combine the overwhelming advantages of CMOS with our exclusive DigitalClarity® technology for best-in-class image quality. Micron’s image sensors are available as stand-alone devices or complete camera systems-on-a-chip, in VGA or multi-megapixel resolutions, with varying pixel sizes, frame rates, and on-chip features. Low cost, low power consumption, and ease of design make them ideal imaging solutions for a wide array of products, ranging from cell phones and DSCs, to high-speed machine vision, automotive, surveillance, and medical applications.
This product profile describes the properties and applications of the ProMetric® I-SC Solution Imaging Colorimeter.
The Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index.
Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.
Prof. Simon Scheuring & Dr. Alma P. Perrino
AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the single-molecule kinetics of wild-type bR (bR-WT) exposed to continuous light and short light pulses.
R. Bruce Weisman
AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.