McPherson, Inc. manufactures Instruments and Systems for Spectroscopy and Spectrophotometry through the optical electromagnetic spectrum. They design and build tools to measure frequency and intensity of light wavelengths / rays with good spectral resolution over a wide free range. McPherson instruments are used in physics research, physical chemistry and astronomy in applications through the X Ray, Vacuum, UV, Visible and Infrared (IR, including MWIR and LWIR) wavelengths. Vacuum and ultra high vacuum (UHV) models are available in most designs.
The National Institute of Standards and Technology (NIST) and many international institutions use their spectrometers and monochromators. Their vast experience in the vacuum range of the ultraviolet has helped them branch into the manufacture of components for the vacuum domain. You will find their manufactured vacuum systems, penetration welded components, and cold stages and mechanisms throughout the industries which employ vacuum and ultra-high vacuum technology.
Their customer list reads like "Who's Who". The broad use of our products has given us great strength and depth.
Their product lines encompass:
Imaging spectrometer for VUV
McPherson High-Voltage Power Supply Series Now Features 10,000V Configuration
McPherson Introduces CCD-UV Absorbance Spectrophotometer
McPherson Offers Compact Double-Monochromator for Standoff Raman Spectroscopy
McPherson STS Spectral Test and Calibration System for Efficient Spatial Performance
McPherson Launches Spectrometer with New Imaging Optics
Grazing Incidence Monochromator - Model 248/310G from McPherson Inc
Czerny-Turner Monochromator - Model 209 from McPherson Inc
Czerny-Turner Monochromator - McPherson Model 207
Vacuum Ultraviolet Monochromator - Model 234/302 from McPherson
The Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index.
This product profile outlines Radiant’s Near-Eye Display Test Solution with Electronic Focus and how XRE lenses are used.
Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.
Prof. Simon Scheuring & Dr. Alma P. Perrino
AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the single-molecule kinetics of wild-type bR (bR-WT) exposed to continuous light and short light pulses.
R. Bruce Weisman
AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.