SCI is a world leader in providing high resolution thin-film metrology systems and analysis software products to leading companies in the semiconductor, optoelectronics, data storage, display, MEMS, and optical coating industries. SCI is a privately held company headquartered in Carlsbad, California, with a global network of sales, service, and support offices strategically located in the United Kingdom, Germany, Taiwan, Singapore, Korea, and Japan.
SCI was founded in 1993 to provide software products for thin-film analysis and design to the research and development community and the optical coating industry. SCI's FilmWizardTM software was introduced the same year, and continues to be recognized as the leading software package for thin-film analysis and design. In 1998, SCI expanded into the wafer metrology business and introduced the FilmTekTM line of thin-film metrology systems based on the reflection of broadband light. In 1999, SCI developed and patented multi-angle differential power spectral density technology and introduced the FilmTekTM 4000, a metrology system with a resolution 100 times better than existing tools. The FilmTekTM 4000 quickly became the standard film metrology tool used in the production of integrated optical components for the optical telecommunications industry. In early 2003, SCI developed multi-angle differential polarimetry technology and introduced the FilmTekTM 4000EM-DUV, a metrology system which is far more sensitive to changes in very thin films, particularly films within multi-layer stacks, than existing metrology tools that rely on conventional ellipsometry or reflectometry techniques. SCI continues to innovate and develop new technologies to provide the highest-resolution metrology tools available for our customers in the semiconductor, optoelectronics, data storage, display, MEMS, and optical coating industries.
The Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index.
This product profile outlines Radiant’s Near-Eye Display Test Solution with Electronic Focus and how XRE lenses are used.
Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.
Prof. Simon Scheuring & Dr. Alma P. Perrino
AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the single-molecule kinetics of wild-type bR (bR-WT) exposed to continuous light and short light pulses.
R. Bruce Weisman
AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.