Managing innovation and staying competitive are major challenges facing companies in every area of private enterprise. To deal successfully with the complexities of these challenges, SORL has concentrated its efforts on satisfying the needs of customers who depend on aspheric optical systems and instrumentation for a wide range of research and test applications. These include surface analysis, focal length measurement, MTF, MRT, and OTF determination, spectroscopy, laser beam evaluation, stress/strain analysis, and optical diagnostics. Achieving all these specialized demands utilizes SORL's expertise in the unit and quantity production and testing of spherical, flat, and aspheric optical components and systems in the vacuum ultra-violet, ultra-violet, visible and infrared spectra, to fractional wavelength accuracies.
This product profile describes the properties and applications of the ProMetric® I-SC Solution Imaging Colorimeter.
The Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index.
Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.
Prof. Simon Scheuring & Dr. Alma P. Perrino
AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the single-molecule kinetics of wild-type bR (bR-WT) exposed to continuous light and short light pulses.
R. Bruce Weisman
AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.