Combining the state-of-the-art in diode array detectors with advanced statistical algorithms in a compact, ruggedized package, the Spectraline Mid-Infrared Imaging spectrometer truly represents the future of spectroscopy in process and quality control. With its unmatched speed, reliability and extended life, it answers the long felt need by the industry for continuous product monitoring enabling cost savings through reduced wastage. Mid-Infrared operation provides strong signals and insensitivity to environmental influences. User supplied samples can be calibrated ahead of time and incorporated into the chemometric software of the instrument rendering tedious and repeated process calibration, a thing of the past.
This product profile describes the properties and applications of the ProMetric® I-SC Solution Imaging Colorimeter.
The Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index.
Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.
Prof. Simon Scheuring & Dr. Alma P. Perrino
AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the single-molecule kinetics of wild-type bR (bR-WT) exposed to continuous light and short light pulses.
R. Bruce Weisman
AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.