ADE Corporation is a leading supplier of metrology and inspection systems for the semiconductor wafer, semiconductor device, magnetic data storage and optics manufacturing industries. Wafer suppliers and device manufacturers worldwide rely on ADE measurement and inspection systems to certify and ensure the highest quality bare silicon substrates. ADE's most recent generation of products serve both 65nm in-line manufacturing applications and 45nm process development. Semiconductor device yields begin with the bare wafer, and ADE's leading technology provides early insight into surface defect, shape, flatness and nanotopography of these advanced 300mm substrates.
The Monarc Pro T System turns any microscope into an optically-coupled microscope, enabling in-situ discovery for photoactive catalyst studies.
Discover the NAN™ Electrophysiology focusing nosepiece microscope by Sutter instruments.
The Total Absolute Measurement System (TAMS) unit allows you to choose the right detector for angular-dependent measurements of optical properties of thin and thick samples.
In this interview, AZoOptics speaks with Teledyne Dalsa about the key roles of optics when it comes to Machine Vision Systems.
Dr. Mustafa Kansiz
In this interview conducted at Pittcon 2023 in Philadelphia, Pennsylvania, we spoke to Mustafa Kansiz, Director of Product Management and Marketing at Photothermal Spectroscopy Corp, about O-PTIR, a new and alternative infrared spectroscopy method.
Professors Susmu Noda and Menaka De Zoysa
In a new interview, AZoOptics talks with Professors Susmu Noda and Menaka De Zoysa about their research presenting a new nonmechanical 3D Lidar system.