ADE Corporation is a leading supplier of metrology and inspection systems for the semiconductor wafer, semiconductor device, magnetic data storage and optics manufacturing industries. Wafer suppliers and device manufacturers worldwide rely on ADE measurement and inspection systems to certify and ensure the highest quality bare silicon substrates. ADE's most recent generation of products serve both 65nm in-line manufacturing applications and 45nm process development. Semiconductor device yields begin with the bare wafer, and ADE's leading technology provides early insight into surface defect, shape, flatness and nanotopography of these advanced 300mm substrates.
The Thermo Scientific™ ARL™ EQUINOX 3000 X-ray Diffractometer for research enables accurate measurements.
KLA’s Filmetrics F40 allows you to transform your benchtop microscope into an instrument to measure thickness and refractive index.
This product profile describes the properties and applications of the ProMetric® I-SC Solution Imaging Colorimeter.
Dr. David Dung
We spoke with University of Bonn spin-off Midel Photonics, a start-up company whose laser beam shaping technology is hoping to sharpen up the laser industry.
Matthias Sachsenhauser, Ph.D.
Following Laser World of Photonics 2022, we spoke with Matthias Sachsenhauser from Hamamatsu Photonics about the role of laser-driven light sources in the future of the photonics sector.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.