Omniscan is a supplier of leading edge surface analysis instrumentation and metrology solutions to industry and academia. Omniscan has provided high quality and focussed solutions to academic and industrial customers for the past 10 years.
We provide instrumentation and consulting for measurement of surface roughness, waviness and shape; layer thickness and optical properties ranging from the sub-nanometer to the cm scales along with surface modification and laser lithography. Drawing on over 20 years of scientific training and technical experience we aim to offer a lot more than simply supplying equipment.
Surface analysis and metrology instrumentation
Discover the NAN™ Electrophysiology focusing nosepiece microscope by Sutter instruments.
The Total Absolute Measurement System (TAMS) unit allows you to choose the right detector for angular-dependent measurements of optical properties of thin and thick samples.
The Verifire™ Asphere+ provides high-performing, flexible, and precise aspheric metrology.
Dr. Mustafa Kansiz
In this interview conducted at Pittcon 2023 in Philadelphia, Pennsylvania, we spoke to Mustafa Kansiz, Director of Product Management and Marketing at Photothermal Spectroscopy Corp, about O-PTIR, a new and alternative infrared spectroscopy method.
Professors Susmu Noda and Menaka De Zoysa
In a new interview, AZoOptics talks with Professors Susmu Noda and Menaka De Zoysa about their research presenting a new nonmechanical 3D Lidar system.
Dr. Quentin Meyer and Dr. Ying Da Wang
In a new feature, AZoOptics talks with Dr. Quentin Meyer and Dr. Ying Da Wang about their novel technology that allows for superior imaging of hydrogen fuel cells.