McBain Systems announced that it will display its recently launched automated wafer handling systems, and near-infrared (NIR) defect detection and review (DDR) stations at the Semicon West show, San Francisco in late July. The DDR300 NIR system has been installed in a semiconductor fab in Malaysia for checking defects and subsurface cracks in flip-chip devices. This system has the ability to see-through materials such as silicon.
The system functions in the spectral range of 900 - 1700 nm and has the highest resolution than any other instrument of its class. Two models of DDR300 NIR are available for examining 200nm and 300nm wafers.
The company will also be displaying its unique wafer loading systems at the show. These systems are cost-effective, offering semi-automated, streamlined loading of wafers. They provide throughputs of more than 750 wafers in an hour. The wafer loading systems can be used in a wide array of optical inspection systems. Two different models of wafer loading systems are offered to handle various wafer sizes between 3 and 8 in.
McBain Systems specializes in producing and delivering high performance systems that can be used in various industries such as aerospace, semiconductor, and medical device production.