Feb 16 2010
XOS, a global manufacturer of analysis systems is featuring their High Definition XRF (HDXRF) technology at both the 2010 American International Toy Fair in New York City (February 14-17) and the International Consumer Product Health and Safety Organization (ICPSHO) Annual Meeting and Symposium in Washington, D.C. (February 15-18). The HDXRF technology provides the most precise measurement of lead and cadmium in the industry.
XOS, Inc. recently developed a line of instruments, which accurately detects the presence of cadmium, lead, and other toxic elements separately in surface coating and in substrates of toys, jewelry, and other consumer products. “This non-destructive technology allows for precise detection and quantification of elements at extremely low levels,” said Satbir Nayar, Product Manager – HDXRF. “As manufacturers, importers and retailers continue to tackle the serious issue of cadmium in children’s products; this technology provides the tools necessary to measure toxic substances in toys and other consumer products.”
Unlike legacy XRF, HDXRF uses multiple energy beams and specialized optics to analyze the paint layer separately from the substrate, while also dramatically optimizing the detection sensitivity that often causes hand-held XRF instruments to leave elements such as lead and cadmium undetected. This next generation technology has been validated and proven effective in independent laboratory studies, and is currently in use in federal and state laboratories and third party lab tests.
XOS is demonstrating its HDXRF technology at the American International Toy Fair in New York (booth 5350) and the International Consumer Product Health and Safety Organization (ICPSHO) Annual Meeting and Symposium in Washington, D.C. (February 15-18).
Source: http://www.xos.com/