New Quantitative AFM Mode for High-Resolution Material Mapping

Veeco Instruments Inc., a leading provider of instrumentation to the nanoscience community, today introduced HarmoniXTM, a powerful new atomic force microscope (AFM) technique for high-resolution nanoscale imaging and analysis. Veeco's HarmoniX Nanoscale Material Property Mapping enables AFM users to simultaneously, and in real-time, acquire high-resolution images as well as high-resolution, quantitative material property maps. The HarmoniX mode is now available on all Veeco scanning probe microscopes that are powered by the new NanoScope® V controller, including the MultiMode® V, DimensionTM V, and BioScopeTM II.

David Rossi, Vice President, General Manager of Veeco’s Nano-Bio AFM Business, commented, "HarmoniX is a significant breakthrough in SPM technology and opens the door to quantitative material property characterization at speeds and levels of resolution previously impossible. Our product scientists and engineering team collaborated with Dr. Ozgur Sahin, of the Rowland Institute at Harvard, to develop and bring this new patented technique to market. Thousands of publications have referenced Veeco’s AFMs, and we believe that HarmoniX, available exclusively from Veeco, represents a major leap forward to enable our customers’ further scientific discoveries.”

Dr. Bede Pittenger, Veeco Development Scientist, added, “HarmoniX provides an AFM user the ability to simultaneously capture quantitative maps of material properties, such as elasticity, adhesion, dissipation and peak force. The HarmoniX technique renders these maps at speeds that are orders of magnitude greater than currently-available force techniques, with the same level of high resolution our customers are accustomed to with Veeco’s TappingModeTM.”


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