Jan 29 2008
Nikon Instruments, Inc. today announced the launch of NIS-Elements C, which delivers the highest level of comprehensive confocal and widefield imaging in a single unifying software platform. This newest version of Nikon's imaging microscopy software enables full integration of confocal specific acquisition controls together with advanced image analysis functionality. NIS-Elements C's dedicated interface for A1 confocal microscope automation addresses all of the various acquisition modalities, including dual scanners with photo activation capabilities.
In conjunction with the specific confocal functionality, the NIS-Elements platform has been designed to cover visualization, image analysis, processing and data management. These new features bridge specific confocal applications with the functionality required for data generation and output with exceptional work flow and ease of use. The new Graphical User Interface (GUI) provides for easy instrument set up, experiment work flow and secure data acquisition, storage and analysis.
NIS-Elements C makes observing live changes and graphing intensity during photobleaching and photoactivation easy with a well-developed and purposeful monitoring interface. Also, maximum and minimum intensity projections over time and Z-axis are available instantly. NIS-Elements C allows diverse image acquisition and analysis methods with techniques such as Colocalization, 2-D Object Tracking and Kymograph displays.
"NIS-Elements C has been greatly enhanced to seamlessly integrate confocal acquisition and imaging with the management of all automated microscope functions," said Stan Schwartz, vice president, Nikon Instruments, Inc. "It maintains both the ease of use and all of the advanced analysis functions of the original NIS-Elements software, continuing to position NIS-Elements as the industry's premier platform for microscopy imaging analysis solutions."
NIS-Elements' core functionalities include rapid volume views, renderings and rotations; automated object counting; multiple binary layer thresholding and processing. Modules such as 3-D Blind Deconvolution, 2-D Real Time Deconvolution and Extended Depth of Focus are also available, further enhancing and augmenting NIS-Elements' product depth.
NIS-Elements C makes it possible to capture, display, analyze and export data generated from 6-D datasets. Volume and titled views, image counts, live graphing and intensity information are available during acquisition. As the quantity and complexity of image datasets increase, NIS-Elements adds the necessary intuitive workflow and controls for data extraction, management and export.