WITec has announced that its True Surface Microscopy has received the Editor’s Gold Award at the 2011 PITTCON symposium and technical exhibition, which was held in Atlanta from 14 to 17 March, 2011.
The True Surface Microscopy is considered as a vital technological development aimed at simplifying the Raman imaging procedure on samples with rough, large or inclined surfaces.
More than 150 editors were involved in the award selection process and awards were presented under Silver, Bronze and Gold categories. The event attracted approximately 20,000 attendees that included academia, industry and government. Sophisticated analytical instruments were displayed at the expo.
The True Surface Microscopy mode from WITec enables users to carry out confocal Raman imaging and also to follow the surface topography with high accuracy. This mode enables users to keep rough or inclined samples in focus while conducting confocal Raman imaging.
The WITec alpha500 series is equipped with a built-in sensor for optical profilometer measurement. The topographic coordinates from the profilometer determination are utilized to trace the surface of the sample in confocal Raman imaging mode. This revolutionary imaging mode reveals the chemical properties at the sample surface.