CRAIC Technologies, a company specializing in UV-visible-NIR microspectroscopy devices, has launched a new UV-visible-NIR spectrophotometer for microscopes.
The 308 PV spectrophotometer is suitable for a number of applications such as thin film measurement in semiconductors, high-resolution relative intensity and colorimetric mapping of flat panel displays, spectral analysis of minerals and vitrinite reflectance of coal.
The 308 PV can be integrated into a probe station or an open photoport of microscope. It examines the spectra of several types of microscopic samples without causing any damage. In addition, the spectrophotometer incorporates CRAIC Technologies’ Lightblades spectrophotometer technology and obtains spectra of high-resolution color images and microscopic sample areas by fluorescence, luminescence, reflectance and absorbance, when integrated to microscopes.
With CRAIC Technologies Traceable Standards, the 308 PV serves as an economical micro-analysis tool for manufacturing facility or laboratory. In addition, it offers increased stability and sensitivity.