Fries Research & Technology GmbH (FRT) offers a comprehensive range of metrological surface measuring systems for the non-destructive investigation of topography, thickness, roughness, abrasion, and many other properties. Reputable international companies from the automotive, semiconductor, MEMS, optics or pharmaceutical industries equip their R&D and production departments with FRT metrology systems.
FRT operates from Bergisch Gladbach, Germany and maintains subsidiaries in the United States and Switzerland. Additionally, FRT provides a distribution and service network in Asia and Europe, and recently opened a branch office in Munich.
Discover the NAN™ Electrophysiology focusing nosepiece microscope by Sutter instruments.
The Total Absolute Measurement System (TAMS) unit allows you to choose the right detector for angular-dependent measurements of optical properties of thin and thick samples.
The Verifire™ Asphere+ provides high-performing, flexible, and precise aspheric metrology.
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