Founded in 1997, Armstrong Optical Ltd. is a specialist supplier of optical metrology instruments for both R&D and production. This includes interferometers for measuring shape, distance and thickness and instruments for MTF, optical centration, focal length and most optical parameters. In addition we supply chromatic confocal sensors and controllers and custom optical / mechanical assemblies. We are partners in the UK for Trioptics, SIOS, Precitec Optronik and other fine companies.
Trioptics is the leading manufacturer of optical test equipment for research and production. This includes instruments to measure optical centration, lens thickness, precise angles, straightness, surface form, MTF and other optical parameters including alignment for wavelengths from the UV to the IR. In addition they manufacture precision electronic autocollimators for a range of applications and complete high performance systems for accurate turning of optical components and housings. Every step of the optical manufacturing process is covered including camera and electronics integration.
Our laser metrology instrumentation from SIOS enables sub nm distance and high accuracy angle measurement for such apparatus as machine-tool beds; non-contact shape/thickness measurement of glass containers on production lines; non-contact vibration analysis – from the macro- right down to the micro-scale as well as bespoke automation of measurement requirements.
The wide range of CHRocodile sensors from Precitec Optronik utilise several distinct techniques to perform high speed distance and thickness measurements. Chromatic confocal and interferometric methods are used to measure nearly all surfaces. Various white and infrared light sources are available to extend the ranges of materials that we can measure
We are happy to offer either individual systems or complete tailored solutions to specific requirements and welcome as much dialogue with our customers as possible. So please feel free to contact us at any time either by ‘phone or email.
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The Total Absolute Measurement System (TAMS) unit allows you to choose the right detector for angular-dependent measurements of optical properties of thin and thick samples.
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