Seiler Instrument is a contract manufacturer, specializing in fire-control equipment,
as well as a distributor of surveying instruments, microscopes and Zeiss planetaria.
There are several main divisions at the company: Manufacturing, Surveying, Microscope,
CAD, Night Vision, Planetarium, and Administration.
The Manufacturing Division at Seiler Instrument specializes in optical fire-control
equipment and components for predominately the U.S. Military. The division manufactures
periscopes, telescopes, target collimators, boresights, borescopes, gunsights,
dioptometers, tripods, and metal components and offers CNC machining, turning,
optical/mechanical assembly, testing, SPC, R&D and performs inspections
to MIL-I-45208 or MIL-Q-9858.
Our Surveying Division offers a variety of state-of-the-art equipment from
well known United States, European, and Japanese manufacturers. With additional
offices in Kansas City, Indianapolis, Chicago, and Sheboygan, Seiler instrument
is now even more accessible and able to serve a much wider area. Architects,
contractors, surveyors, and engineers know they can choose from a wide variety
of products ranging from supplies to robotic total stations and GPS systems
All offices offer sales, service, rentals, and training.
Our Microscope Division distributes microscopes for the healthcare industry
in the United States and abroad. The product line starts with the basic binocular
brightfield microscope and extends through the phase contrast and fluorescence
scopes to the colposcope and office surgery microscopes.
The Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index.
This product profile outlines Radiant’s Near-Eye Display Test Solution with Electronic Focus and how XRE lenses are used.
Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.
Prof. Simon Scheuring & Dr. Alma P. Perrino
AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the single-molecule kinetics of wild-type bR (bR-WT) exposed to continuous light and short light pulses.
R. Bruce Weisman
AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.