Microvision is the world leader in the development of light scanning technologies for high-resolution display and imaging systems. These systems use the company¡¦s proprietary silicon micro-mirror technology to enable OEM, ODM, Tier I, and other select partners product solutions for a broad range of industrial, consumer, military, and medical applications.
The company supplies its core expertise to partners in the form of integrated photonic modules (IPM), which are fully integrated display and imaging engines. These engines are being designed to be embedded into our partners product offerings, providing a powerful advantage of price, performance, and packaging that enables new generations of products to meet today¡¦s rapidly emerging market needs.
MicroVision Obtains $8 Million License Fee Payment from its Fortune Global 100 Partner
Fortune Global 100 Customer Places $14.5 Million in Component Orders with MicroVision
MicroVision Grants Fortune Global 100 Company Non-Exclusive License to MicroVision PicoP Display Technology
Major Logistics Company Purchases Customized PicoP Display Modules from MicroVision
Fortune Global 100 Customer Places Nearly $1.9 Million in Component Orders with MicroVision
Tier-One Supplier Acquires MicroVision’s Multiple Prototype SES for Embedded Head Up Display Application
Pioneer CYBER NAVI Car Navigation System Employs MicroVision’s Direct Green Lasers-Based Display
Microvision to Demonstrate 720p HD Ready Laser Pico Projector at SID Event
This product profile describes the properties and applications of the ProMetric® I-SC Solution Imaging Colorimeter.
The Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index.
Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.
Prof. Simon Scheuring & Dr. Alma P. Perrino
AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the single-molecule kinetics of wild-type bR (bR-WT) exposed to continuous light and short light pulses.
R. Bruce Weisman
AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.