With over 30 years of experience, Marktech Optoelectronics is a leading manufacturer of UV visible, near-infrared, and short wavelength infrared (SWIR) emitters, detectors, and materials including InP epiwafers.
Marktech maintains an onsite engineering and design team with expertise in applications and product design. To optimize the performance of customers' applications, Marktech can even design custom components and assemblies, working with manufacturers of any size.
Marktech's extensive support capabilities include onsite labs with state-of-the-art equipment, where their team of experts can test and validate for all optical and electrical parameters. In addition to Marktech's own sensor line, they are a Cree Solutions Provider for high-brightness LED products and materials.
Marktech Optoelectronics Expands Silicon Photodetector Design and Manufacturing Operations
The Process of Creating a Custom Emitter, Detector, or Assembly in Optoelectronics
Thirty Years of Experience in Supplying Custom LEDs
Marktech Optoelectronics Announces Latest Lineup of Advanced Silicon Photodiode Photodetectors
This product profile describes the properties and applications of the ProMetric® I-SC Solution Imaging Colorimeter.
The Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index.
Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.
Prof. Simon Scheuring & Dr. Alma P. Perrino
AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the single-molecule kinetics of wild-type bR (bR-WT) exposed to continuous light and short light pulses.
R. Bruce Weisman
AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.