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Results 1361 - 1370 of 2065 for Spectroscopy
  • Article - 20 Oct 2020
    With benefits ranging from superior optical performance and design flexibility to robustness and consistency, VPH gratings are ideal for applications like laser pulse compression, spectroscopy, and...
  • News - 19 Feb 2008
    A super-sensitive mini-sensor developed at the National Institute of Standards and Technology (NIST) can detect nuclear magnetic resonance (NMR) in tiny samples of fluids flowing through a novel...
  • News - 27 Dec 2007
    An international team of astronomers, led by Professor Svetlana Berdyugina of ETH Zurich’s Institute of Astronomy, has for the first time ever been able to de-tect and monitor the visible light...
  • Equipment
    With incredible low noise imaging, the ORCA-Quest qCMOS camera is the perfect choice for quantitative imaging across all industries and optics needs.
  • News - 19 Nov 2007
    Chalmers University of Technology in Goteborg, Sweden is the first institute in that country to have installed an FEI Titan scanning/transmission election microscope (S/TEM), the world's most...
  • News - 18 Oct 2007
    A US team has developed a technique to image hemoglobin in red blood cells with micrometer resolution, but without the need to inject external contrast agents or dyes into the blood. The method might...
  • News - 12 Oct 2007
    Using a device that can turn a tiny piece of laboratory space into an ion cloud as hot as those found in a nuclear fusion reactor, physicists at the National Institute of Standards and Technology...
  • Article - 28 Aug 2024
    Spectrophotometers are vital for optical analysis, measuring light behavior in materials to enhance research in chemistry, physics, and biomedical sciences.
  • News - 20 Jul 2007
    Advanced Photonix, Inc. has announced that the Picometrix T-Ray(TM) 2000 has been chosen by Tsinghua University, Beijing, China, to be the focal point of their investigations into the applications of...
  • Article - 18 Feb 2025
    Utilizing light reflection, ellipsometry and reflectometry provide distinct approaches to thin-film characterization, crucial for advanced material analysis.

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