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Scientists Created Imaging Device with Layout Based on the Human Eye

By combining stretchable optoelectronics and biologically inspired design, scientists have created a remarkable imaging device, with a layout based on the human eye.

6 Aug 2008

Carl Zeiss SMT Introduces ORION PLUS Helium Ion Microscope

At the Microscopy and Microanalysis 2008 meeting and exhibition being held in Albuquerque, New Mexico, Carl Zeiss SMT, a leading global provider of electron- and ion-beam imaging and analysis equipment, introduced a new, improved Helium Ion Microscope called the ORION® PLUS.

4 Aug 2008

New Class of SEM Centered on Unique GEMINI Technology

At the Microscopy and Microanalysis Meeting and Exhibition being held in Albuquerque, New Mexico, Carl Zeiss SMT is introducing a new class of SEM: SIGMA. Growing customer demand for ease of use and class leading X-ray and analytical geometry took center stage when the product was developed.

4 Aug 2008

Correlative Microscopy Solution Enables Scientists to Acquire High-Res TEM Images of Molecular Entities

FEI Company, a leading provider of high-resolution imaging and analysis systems, and Max Planck Institute (MPI) of Biochemistry, a leading biochemical research institution, announced today their collaboration on a correlative microscopy solution that enables scientists to quickly and easily acquire high-resolution transmission electron microscope (TEM) images of molecular entities found using optical microscopy techniques.

4 Aug 2008

Hitachi Opens New Advanced Scanning Electron Microscope Facility at Cambridge University

Hitachi has opened a new Advanced Scanning Electron Microscope Facility in the Cavendish Laboratories, Cambridge University. The long standing research collaboration between Hitachi and the Cambridge University has been enhanced with the installation of three state of the art scanning electron microscopes. The new facility will make some of Hitachi’s unique instruments, including the S-5500 in-lens SEM, openly accessible to university researchers.

4 Aug 2008

Scientists has Produced Holograms with X-Ray

The pinhole camera, a technique known since ancient times, has inspired a futuristic technology for lensless, three-dimensional imaging. Working at both the Advanced Light Source (ALS) at the U.S. Department of Energy's Lawrence Berkeley National Laboratory, and at FLASH, the free-electron laser in Hamburg, Germany, an international group of scientists has produced two of the brightest, sharpest x-ray holograms of microscopic objects ever made, thousands of times more efficiently than previous x-ray-holographic methods.

1 Aug 2008

Drop-in-Flight Analysis Provides Flexible Platform for Analyzing Performance of Print Head

JetXpert combines state of the art strobing technology with customized optics and powerful ImageXpert software to provide a flexible platform for analyzing the performance of any print head through drop-in-flight analysis and visualization.

31 Jul 2008

Investigating the Fundamental Mechanisms of Chemical Reactions

The Engineering and Physical Sciences Research Council (EPSRC) has awarded a research grant worth £6 million over five years to a team of academics from the University of Bristol’s School of Chemistry and colleagues from the University of Oxford.

31 Jul 2008

Highly Flexible Readout Mode Capable of Achieving Extremely Fast Continuous Frame Rates

Today Andor Technology plc (Andor), a world leader in scientific imaging and spectroscopy solutions, announces the implementation of the 'Cropped Sensor' Mode as a standard, user-selectable feature with its iXon+, Newton and iKon range of high-performance EMCCD and CCD cameras. This highly flexible and specialized readout mode is capable of achieving extremely fast continuous frame rates (typically sub-millisecond exposures) of either images or spectra.

31 Jul 2008

World's First Analysis Microscope Without an Imaging Lens

Hitachi Ltd and Hokkaido University prototyped an electron analysis microscope that produces an enlarged image by irradiating an electron beam from a scanning electron microscope (SEM) to a specimen and analyzing the diffraction pattern of the scattered light.

30 Jul 2008