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Making Supertelescopes Much More Sensitive

Nanotechnologist ir. Chris Lodewijk has succeeded in significantly increasing the sensitivity of the new supertelescopes in Chile. He will receive his PhD on this topic at TU Delft on Monday 2 February.

2 Feb 2009

Camera Commander System Increases Sensor Quality Control with Automated Analysis for Dramatically Reduced Testing Time

Sarnoff Corporation today announced the launch of Camera Commander™, a complete CMOS and CCD imaging device and camera testing system for camera manufacturers and their users.

27 Jan 2009

SiOnyx Boosts CMOS Sensor Team, Opens West Coast Office

SiOnyx, Inc., the leading innovator in shallow junction photonics - a patented semiconductor process coined 'black silicon' that radically alters the photonic properties of semiconductor devices - has added several leading image sensor scientists and engineers to its team and opened an engineering office in Beaverton, Oregon.

27 Jan 2009

CU-Boulder Professor Wins $3 Million Fellowship from DoD

University of Colorado at Boulder physics Distinguished Professor Margaret Murnane has been named a National Security Science and Engineering Faculty Fellow by the U.S. Department of Defense.

27 Jan 2009

Air Force Researcher Develops Satellite Imaging Technology

A research associate at the U.S. Air Force Academy's Laser and Optics Research Center here is developing a new capability that will allow satellites to be seen and see clearer.

26 Jan 2009

Eco-Snow Systems Introduces New, Automated Technology for Cleaning Image Sensors

Eco-Snow Systems™, an affiliate of The Linde Group, has introduced a new, automated technology for cleaning image sensors. Eco-Snow Systems is the leading supplier of automated, carbon dioxide (CO2) snow based cleaning tools and processes to the micro-electronics industry.

26 Jan 2009

Keithley Releases New 2009 Test and Measurement Product Guide

Keithley Instruments, Inc. (NYSE: KEI), a leader in solutions for emerging measurement needs, announces the release of its 2009 Test and Measurement Product Guide. The 144-page guide offers details and technical specifications on Keithley's general-purpose and sensitive sourcing and measurement products, DC switching, RF switching and measurement, data acquisition solutions, semiconductor test systems, and optoelectronics test.

26 Jan 2009

Device will have Many Important Applications to Quantum Technologies

A team of physicists and engineers has demonstrated an optical device that filters two particles of light (or photons) based on the correlations between their polarisation that are only allowed in the seemingly bizarre quantum world. This so called "entanglement filter" passes the pair of photons only if they inhabit the same quantum state, without the user (or anything else) ever knowing what that state is.

22 Jan 2009

Spectrometer Modules MCS FLEX Supplement Successful Spectral Sensor Line from Carl Zeiss

Carl Zeiss has added the MCS FLEX modules to its line of spectral sensors. The Multi Channel Spectrometer modules will be presented for the first time at the Photonics West trade show in San Jose, California, from January 27 to 29, 2009.

22 Jan 2009

Company Offers Unique Portfolio of Patterned Coatings Solutions for OEM Applications

Optics Balzers AG, formerly Oerlikon Optics, is a leading supplier of precision optical components. The company offers a unique portfolio of patterned coatings solutions for OEM applications.

20 Jan 2009

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