Posted in | News | Optics and Photonics

NOVA Launches HelioSense100 Standalone Optical CD system for 3D Wafer Fabrication

Nova Measuring Instruments, a leading innovator and key provider of metrology solutions for advanced process control used in semiconductor manufacturing, announced today the launch of its new standalone Optical CD system, the HelioSense100TM, targeted at the most complex device manufacturing across the semiconductor segments.

Multiple HelioSense100TM systems were ordered already in the last few months and are in use by leading customers worldwide. The company expects to recognize initial revenues for this system within the third quarter of 2015.

With its unique optical technology, combining high precision, superior accuracy and new channels of information, the HelioSense100TM is a state of the art metrology platform that addresses well the most challenging requirements arising from the industry's technological transitions in the next years to come. The HelioSense100TM supports the industry transition to multi-patterning small pitch manufacturing and 3D vertical devices by offering a wide range of metrology measurements that drive tighter process control for the most critical parameters in Logic, Flash and DRAM.

The HelioSense100TM system is enhanced by Nova's modeling solutions, as part of the latest NovaMARS modeling software, and Nova's newly introduced high performance computation solution, allowing customers to adopt the new system in early R&D stages and effectively utilize it all the way to later stages of high-volume manufacturing and device maturity.

"As a leading metrology innovator for advanced process control, we are committed to maintaining our technological lead by introducing new breakthrough solutions that will assist our customers in their growing technology challenges and contribute to their long term success," stated Eitan Oppenhaim, Nova's President and CEO. "Across all industry segments our customers require advanced metrology systems that can control complex process parameters in the most advanced nodes. The HelioSense100TM is exactly this tool, featuring state-of-the-art technology that combines multiple innovations, pushing the metrology technical envelope even further. The multiple orders and installations we have so far are a vote of confidence in the newly introduced technology, and we are excited from its market adoption so far."

Source: http://www.novameasuring.com/

Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback
Your comment type
Submit

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.