LOT announced that it is providing the XE-100 AFMs (atomic force microscopes) at a discounted price for a limited period. The AFMs are a product of Park Systems with step-and-scan automation and a decreased drift rate.
XE-100 AFM
The step-and-scan automation offers high AFM performance in Non-Contact nanoscale metrology. It can adapt to a wide array of optical couplers and is suitable for electrochemistry, polymers, and materials science, in addition to engineering and neuroscience applications.
LOT is also offering a discounted price for the KLA-Tencor D-100 stylus surface profiler and the MicroXAM-100 optical surface profiler. The D-100 profilometer quantitatively and swiftly evaluates the two-dimensional topography of surfaces. The profilometer’s measurement solutions include a manual x-y theta sample positioning stage, six angstrom step height repeatability, sub-angstrom resolution and an 800 µ Z range.
The MicroXAM-100 three-dimensional optical surface profiler has the ability to evaluate fields of view ranging from 2x2 mm to 100x100 µ. The device precisely and swiftly evaluates the three dimensional topography of surfaces in nanometers by using a z-scan range of 250 µ. Numerous images can be connected together to generate an extended field of view by using three-dimensional image stitching capabilities.
Source: http://www.lot-oriel.com/