The NanoScan™ beam profiler allows users to effectively measure their beam compared to conventional methods, as scanning slit beam profiling provides submicron precision in measuring both beam size and position.
The system has different scan head configurations, such as germanium, pyroelectric, and silicon versions. These versions are ideal for measuring different laser-power levels and wavelengths.
Image Credit: MKS Ophir
NanoScan™ 2s Si/3.5/1.8 Silicon Scanning 1.8 µm Slit Beam Profiler
- Power levels from 10 nW to 10 W
- 3.5 mm aperture for beam sizes from 7 µm to 2.3 mm
- Silicon detector covers the 190 to 1100 nm spectral range
NanoScan™ 2s Si/9/5 Silicon Scanning 5 µm Slit Beam Profiler
- Power levels of 10 nW to 10 W
- 9 mm aperture for beam sizes from 20 µm to 6 mm
- Silicon detector covers the 190 to 1100 nm spectral range
NanoScan™ 2s Ge/3.5/1.8 Germanium Scanning 1.8 µm Slit Beam Profiler
- Power levels from 10 nW to 10 W
- 3.5 mm aperture for beam sizes from 7 µm to 2.3 mm
- Germanium detector covers the 700 to 1800 nm spectral range
NanoScan™ 2s Ge/9/5 Germanium Scanning 5 µm Slit Beam Profiler
- Power levels from 10 nW to 10 W
- 9 mm aperture for beam sizes from 20 µm to 6 mm
- Germanium detector covers the 700 to 1800 nm spectral range
NanoScan™ 2s Pyro/9/5 Pyroelectric Scanning 5 µm Slit Beam Profiler
- Pyroelectric detector covers the 190 nm to 100 µm spectral range
- Power levels of 5 mW to 100 W
- 9 mm aperture for beam sizes from 20 µm to 6 mm