In MFM, the tip detects the magnetic interactions at the surface of the material and builds up a spatial distribution map of the material’s magnetic structure.
By Liam Critchley
5 Dec 2018
EFM is one of the few methods where it is an adaptation of just AFM principles for deducing specific properties of materials.
By Liam Critchley
5 Dec 2018
C-AFM is a type of AFM mode that uses a sharp conductive tip (often a conductive diamond-coated silicon tip).
By Liam Critchley
5 Dec 2018
AFM has become a widely used technique for many reasons. It is most frequently used to determine the topography of a surface.
By Liam Critchley
5 Dec 2018
Atomic force microscopy (AFM) is a powerful and versatile microscopy technique that has been used across many scientific disciplines for decades. While it is a single technique, there are many ways in which it can be used.
By Liam Critchley
5 Dec 2018
Piezoresponse force microscopy (PFM) is a variation of atomic force microscopy (AFM) that uses a conductive probe tip to measure the piezoelectric, and more commonly the ferroelectric, domains of a material.
By Liam Critchley
5 Dec 2018
In this interview AZoNetwork spoke to STEMMER IMAGING about The importance of software solutions in the future of machine vision.
Photoconductive AFM (pc-AFM) is a variation of AFM that has been specifically designed to measure the photoconductivity of a surface.
By Liam Critchley
5 Dec 2018
AZoOptics speaks to EVT at Vision 2018 about the Software in Machine Vision and the Importance of Custom Solutions and their role in machine vision.
In this interview AZoNetwork speaks to Inivation AG about Neuromorphic Vision Systems and if they will they make Traditional Machine Vision Systems Obsolete