Semilab Semiconductor Physics Laboratory designs, produces and sells metrology equipment for the characterization of semiconductor and photovoltaic materials, for monitoring the manufacturing process of semiconductor devices and solar cells, and also for R&D purposes in these areas. Semilab offers a variety of measurement techniques; most of them are non-contact and non-destructive. Many of Semilab's technologies can be flexibly integrated in different platforms, ranging from simple handheld devices and table-top systems with high resolution mapping capability to fully automated stand-alone production control tools for mid-range and high-level fablines. Semilab also offers in-line measurements for solar cell production lines.
Our strategy is to continuously improve our products, and to offer flexible solutions for our customers' needs with high-value products for a reasonable price. To accomplish this, Semilab employs more than 70 physicists and 90 engineers worldwide. Semilab also participates in various international R&D projects, and Semilab has a frame agreement for metrology development with IMEC, the largest international research center for the development of semiconductor products.
Semilab carries out our work in a responsible way; Semilab provides various benefits to our employees and support important cases such as scientific education.
Dielectric Film Measurement By Ellipsometry: Principles, Applications And Benefits
Ellipsometry: What is it and Why is it Useful in Optics?
Ellipsometric Porosimetry: An Introduction
What is Spectroscopic Ellipsometry and Why is it Useful?
Spectroscopic Ellipsometer with Rotating Compensator - SE-2000
Cost-Effective Non-Destructive and Non-Contact Optical Measurements on Substrates - SE-1000
Ellipsometric Spectra Analysis at the Time of Layer Deposition - inSE-1000
This product profile describes the features and characteristics of the zoom lens.
The Thermo Scientific™ ARL™ EQUINOX 3000 X-ray Diffractometer for research enables accurate measurements.
KLA’s Filmetrics F40 allows you to transform your benchtop microscope into an instrument to measure thickness and refractive index.
In this interview, AZoOptics talks to Davis Bowling, who provides guidance into extended reality (XR) optical testing and demonstrates how to optimize the testing process.
AZoOptics speaks to Jan Novotný, one of the founding members of Lightigo, about the significance of laser-induced breakdown spectroscopy (LIBS) in the elemental analysis field. Discussing Lightigo's rapid technology, Novotný discusses the latest trends in LIBS technology and its many benefits in several applications.
Dr. Stefan Weber
AZoOptics speaks to Phaseform, whose approach to adaptive optics is helping to refine optic technologies across applications like life sciences microscopy and optical inspection.