Oct 21 2008
Ambios Technology, Inc. introduced its new Q-View White Light Interferometer / SPM system at the Twenty-Third Annual Meeting of the American Society for Precision Engineering in Portland, Oregon. This new system combines the capability of white light interferometry and SPM technology.
The Q-View Interferometric Module integrates seamlessly onto the Q-Scope SPM platform. Q-View uses optical profiler technology to render and measure a large area (500µm) in a few seconds. Switch to SPM mode and characterize surface structures at the sub-angstrom level. Rick Olds, Sales and Marketing Manager of Ambios Technology, commented, "The synergy of combining SPM and Interferometer technology on a single platform will greatly enhance surface imaging and metrology for the community of SPM users."
Q-View White Light Interferometer / SPM is provided as a fully integrated system with the benefits of two technologies on one unified platform. In addition, the Q-View Interferometer module is available as an upgrade for existing Q-Scope customers.