SUSS MicroTec machines are used by leading semiconductor manufacturers as well as renowned research institutes to make and test state-of-the art microchips and sensors. Many of the products you use in your daily life such as PDA’s, GPS systems, cell phones etc. have at sometime been touched by equipment from SUSS MicroTec.
As a global supplier of production and test equipment for the semiconductor and related industries SUSS is especially present in markets including Advanced Packaging, MEMS, Nanotechnology, Compound Semiconductor, Silicon-On-Insulator and 3D Interconnect. Products include precision lithography tools (mask aligners, spin & spray coaters), wafer bonders and device bonders as well as test systems.
Our commitment to superior performance, cost effective solutions and high levels of customization have made SUSS equipment both market and technology leaders throughout the world. In addition to leading the industry in the area of submicron accuracy, we are renowned for our dedication to designing equipment readily adaptable to both unique and rapidly changing manufacturing environments. Our broad product range coupled with our extensive after-sales support result in exceptional relationships with our customers.
SUSS MicroTec Unveils Mask Aligner for HB-LED Production
The Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index.
This product profile outlines Radiant’s Near-Eye Display Test Solution with Electronic Focus and how XRE lenses are used.
Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.
Prof. Simon Scheuring & Dr. Alma P. Perrino
AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the single-molecule kinetics of wild-type bR (bR-WT) exposed to continuous light and short light pulses.
R. Bruce Weisman
AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.