In the early 2000s, based on core technologies such as field emission electron guns and objective lenses developed at the Korea Research Institute of Standards and Science, ModuleSci entered the market of high-resolution scanning electron microscopes (SEM).
We currently manufacture reliable and cost-effective high-resolution SEMs. Furthermore, we have developed an innovative item, correlative light-electron microscopes (CLEM). Researchers are now able to obtain optical microscope and SEM images simultaneously on one platform.
The Filmetrics F20 benchtop film thickness measurement tool is a general purpose instrument for measuring thickness and refractive index.
This product profile outlines Radiant’s Near-Eye Display Test Solution with Electronic Focus and how XRE lenses are used.
Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
Dr. Keith Paulsen
AZoOptics speaks to Dr. Keith Paulsen about the importance of breast cancer detection and the introduction of his team's deep-learning algorithm that associates spatial images of tissue optical properties with optical signal patterns measured during an imaging experiment or patient exam.
Prof. Simon Scheuring & Dr. Alma P. Perrino
AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the single-molecule kinetics of wild-type bR (bR-WT) exposed to continuous light and short light pulses.
R. Bruce Weisman
AZoOptics interviews R. Bruce Weisman from Rice University in Texas, US, who has discovered fluorescence from silicon nanoparticles in cement and how it can be used to reveal early signs of damage in concrete structures.